SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. It is non-destructive and reliable, requires no, or very little, sample preparation and is suitable for solid, liquid and powdered sam.
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This rugged 245x250x90mm portable spectrometer delivers fast, precise elemental identification in the field. The 50kV X-ray tube and high sensitivity Si-PIN diode detector provide accurate analysis of metal alloys, impurities, and more. The new SPECTRO xSORT handheld XRF boasts numerous new features and designs aimed at enhancing user speed, ease, and convenience, while also delivering advanced analytical performance.
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This rugged 245x250x90mm portable spectrometer delivers fast, precise elemental identification in the field. The 50kV X-ray tube and high sensitivity Si-PIN diode detector provide accurate analysis of metal alloys, impurities, and more. When handhelds aren't enough, the amazing new SPECTROPORT portable metal analyzer applies more advanced OES technology — in a unit as easy to use as a handheld analyzer. SPECTROPORT delivers many advantages of SPECTRO's portable OES flagship, SPECTROTEST, in a smaller, lighter package. lyte® is a mobile spectrometer, optimized for use in metal production, metal processing and metal recycling. Spark mobile optical emission spectrometers (OES) excel at providing full chemistry of critical alloy elements at low detection limits that handheld X-ray and LIBS analyzers can't: carbon, phosphorus, sulfur, boron, arsenic and tin in low alloy and stainless steels, and nitrogen in duplex steels.
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D22 possesses the largest area multidetector (3 He) of all small-angle scattering instruments (active area 1 m 2), with a pixel size of 0. This guide provides some simple and easy to use design guidelines and formulas for designing, evaluating and comparing various diode array, diffraction grating based spectrometers designs The input to the design process is the wavelength range you want to cover and the optical resolution by which. Optical spectroscopy is a technique that is used to measure light intensity in the ultraviolet (UV), visible (VIS), near-infrared (NIR), and infrared (IR) range of the electromagnetic spectrum. Optical scatterometry or optical critical dimension (OCD) is one of the most prevalent inline metrology techniques in semiconductor manufacturing because it is a quick, precise and non-destructive metrology technique.
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The optical detector records the intensity of the light that reaches it as a function of its wavelength.
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